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In addition, if the crack is isolated or located inside the cell, this will lead to a relatively low current, resulting in a degradation of the solar cell performance. This is often due to the thermoelectric effect (TE) phenomenon, where the cell can overheat or slightly below, because the cell is thermally less conductive and the current is less conductive.
Another issue is that the cracks can rupture a passivation layer of amorphous silicon (a-Si:H), resulting in a tunnel leakage current. A similar reduction in the photo-generated current caused by the cracks was reported by 9 and 10 in thick cells. We confirm that the observed reduction in the output power is less significant in thin cells and that the threshold for this is lower than that of the thick cells. Figure 6 shows that the loss in power for the photovoltaic cells with cracks is greater than the cells without cracks. This suggests that the path of the crack is a crucial factor to degrade the performance of the solar cells.
While cracks can be caused by various factors during the fabrication process, their occurrence is also influenced by the mounting (e.g., adhesion) between the solar cell and its encapsulation. The mounting between the cell and the encapsulation is an important part of the encapsulation to protect the cell structure. During the process, if the encapsulation is adhered too well, then the cracks at the cell interface may be protected from external factors, such as, moisture and other contaminants.
If the cracks do not participate in the adhesion process or if they are not protected by the adhesive, the crack will gradually grow due to the stresses between the package and the cell, leading to a reduction in the solar cell output power, as shown in Fig. 6b. Although some cracks are inevitable, they usually occur at limited parts of the solar cell, such as, at the silicon-glass interfaces, near the solder joints, and within the encapsulants or substrates. Therefore, cracks appear very localized in the test setup (e.g., tab. Figure 6 b).
In the last part of this research, the samples are being tested as solar cells. As mentioned above, the same CT700-A samples that were tested as mechanical parts, have also been subjected to PID tests. From the output power readings, it is evident that the PID test has significant influence on the performance of the solar cells that were tested. As shown in Fig. 13, the solar cells with cracks are exhibiting an output power that is much higher than that of the solar cells without cracks. This difference in performance is even more pronounced for the CSPV6-E-NT-6-650 samples, as the solar cell with no cracks is achieving an average output power of 7.14W, while the solar cell with cracks is yielding 0.096W.
The CTs of the solar cells results in a higher carbon concentration and amounts of the carbides within the matrix. It should be noted that in the previous studies of Ref 41, the solar cells with no cracks after the CTs were subjected to a mechanical deformation that could be the reason for the increase in the amount of the carbides. Thus, the performance of the solar cells, upon CTs at 700C and 800C, is probably due to their higher carbon concentration and the presence of the carbon-rich carbides within the matrix.
The electroluminescence (EL) imaging setup was utilized to test ten solar cells samples with differing crack sizes, varying from 1 to 58%. Our results confirm that minor cracks have no considerable effect upon solar cell output, and they develop no hotspots. However, larger cracks can lead to drastic decreases in the output power, close to 60%. Furthermore, as the crack area increased, there was a further increase in the cell’s temperature under standard test conditions. On the contrary, no hotspots were found for the solar cells affected by significant creak areas (crack percentage>46%) because there were insufficient areas to develop a hotspot. Last, a comparative analysis with solar cells affected by potential induced degradation (PID) was made. We found a strong relationship in the output power losses, and the PID test critically impacted the cells by developing localized hotspots at a temperature level close to 50C.
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